Non-contact sheet resistance and layer thickness measurement device for single point measurements

The EddyCus TF lab 2020 allows manual single point measurements of conductive thin films and layer thickness measurement of thin metal layers in non-contact mode. The compact bench-top device is ideal for fast and accurate measurements of samples up to 200 x 200 mm2 (8 x 8 inches). In addition to the measurement of thin conductive layers also doped wafers and conductive polyme?rs can be analyzed.

Advantages:

Non-contact real time measurement
Precise measurement of conductive thin films
Characterization of hidden and encapsulated conductive layers
Measurement data saving and export functions

Measurement characteristics:

Sheet resistance
Thickness measurement of metal layers
Single point measurement
Quality control, input and output control
Sample sizes: 10 x 10 mm2 to 200 x 200 mm2 (0.5 x 0.5 inches to 8 x 8 inches)
Measurement range: 0.001 to 3,000 Ohm/sq

Applications:

Coated architectural glass, e.g. LowE
Displays, touch screens and flat panel displays
OLED and LED applications
Smart glass
Graphene layers
Photovoltaic wafers and cells
Semiconductor wafers
Metallization layers and wafer metallization
De-icing and heating applications
Battery electrodes
Conductively coated paper and conductive textiles

Software and device control

Very user-friendly software
Intuitive, touch display navigation
Real-time measurement of sheet resistance and layer thickness
Software-assisted manual mapping option
Various data saving and export options